Work

Trends and challenges in VLSI circuit reliability

Year: 2003

Type: article

Source: IEEE Micro

DOI: 10.1109/mm.2003.1225959

Author: C. Constantinescu

Institution: Intel (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2017521824

FWCI: 19.83

Cites: 15

Cited by: 624

Related to: 10