Work

A novel SEM with spin polarization analysis

Year: 1990

Type: article

Abstract: A scanning electron microscope with polarization analysis has been built using an Auger microprobe and a Mott analyser. The instrument uses a high brightness field emission source and has an analytical spatial resolution of <100nm. The instrument has a novel geometry, with the electron gun, energy analyser, and Mott analyser coaxial on a axis normal to the the sample surface. The detection plane of the Mott analyser is parallel to the in-plane magnetization of the sample surface. Spin polarized micrographs of domains at the surface of a Fe-4%Si single crystal show that, even at low magnifications, the scan related asymmetries are minor, and the interpretation of the signal contrast is straightforward.

Source: Journal of Electron Spectroscopy and Related Phenomena

DOI: 10.1016/0368-2048(90)80163-5

Authors: R. Browning, T. Vanzandt, C.R. Helms, H. Poppa, M. Landolt

Institutions: Stanford SystemX Alliance, Stanford University, IBM Research - Almaden, ETH Zurich

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,170

OpenAlex ID: W2020182641

FWCI: 1.405

Cites: 3

Cited by: 6

Related to: 10