Work

A New Built-In Self-Test Design for PLA's with Hligh Fault Coverage and Low Overhead

Year: 1987

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/tc.1987.1676911

Authors: Treuer, Agarwal, Fujiwara

Institutions: McGill University, Meiji University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2023869551

FWCI: 1.633

Cites: 5

Cited by: 7

Related to: 10