Work

Free-carrier and phonon properties ofn- andp-type hexagonal GaN films measured by infrared ellipsometry

Year: 2000

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.62.7365

Authors: A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, T. E. Tiwald

Institutions: University of Nebraska–Lincoln, University of Bremen, J.A. Woollam Company (United States)

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2025339492

FWCI: 11.31

Cites: 74

Cited by: 261

Related to: 10