Work

Development of a methodology for XPS curve‐fitting of the Si 2p core level of siloxane materials

Year: 2004

Type: article

Source: Surface and Interface Analysis

DOI: 10.1002/sia.1917

Authors: Lesley‐Ann O'Hare, Bhukan Parbhoo, Stuart R. Leadley

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2028401570

FWCI: 2.029

Cites: 11

Cited by: 176

Related to: 10