Work

High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO2/β-SiC(100)3x2 Interface Composition

Year: 1998

Type: article

Source: Materials science forum

DOI: 10.4028/www.scientific.net/msf.264-268.391

Authors: D. Dunham, P. Soukiassian, J.D. Denlinger, B.P. Tonner, E. Rothenberg

Institutions: Université Paris-Sud, Lawrence Berkeley National Laboratory

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

OpenAlex ID: W2029736822

FWCI:

Cites:

Cited by: 3

Related to: 10