The NIST x‐ray photoelectron spectroscopy database
Year: 1992
Type: article
Source: Surface and Interface Analysis
Authors: J. R. Rumble, D. M. Bickham, C. J. Powell
Institution: National Institute of Standards and Technology
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2029887802