Work

A functional testing method for microprocessors

Year: 1988

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/12.5992

Authors: L. Shen, S.Y.H. Su

Institutions: Binghamton University, Institute of Computing Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2033076836

FWCI: 0.433

Cites: 13

Cited by: 39

Related to: 10