Work

On modeling faults in FinFET logic circuits

Year: 2012

Type: conference-paper

Source: Proceedings/Proceedings - International Test Conference

DOI: 10.1109/test.2012.6401565

Authors: Yuxi Liu, Qiang Xu

Institution: Chinese University of Hong Kong

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2041508134

FWCI: 2.319

Cites: 14

Cited by: 59

Related to: 10