Work

Circuits for disjunction admitting short unitary diagnostic tests

Year: 2010

Type: article

Source: Discrete Mathematics and Applications

DOI: 10.1515/dma.2010.039

Author: S. R. Bedzhanova

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2042331908

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