Work

MVP: Capture-Power Reduction with Minimum-Violations Partitioning for Delay Testing

Type: article

Authors: Zhen Chen, Krishnendu Chakrabarty, Dong Xiang

Institutions: Tsinghua University, Duke University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2043735935

Cites: 21

Cited by: 13

Related to: 10