Work

NEXAFS/XPS spectra, and information depth using low energy electron spectromicroscopy in a VPPEM

Year: 2014

Type: article

Source: Journal of Electron Spectroscopy and Related Phenomena

DOI: 10.1016/j.elspec.2014.06.005

Author: R. Browning

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Small Business Innovation Research, National Institute of Standards and Technology

Awards: G4268013211, G5988502807

OpenAlex ID: W2045315496

FWCI: 0.394

Cites: 21

Cited by: 4

Related to: 10