Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants
Year: 1998
Type: article
Source: Thin Solid Films
Author: R.A Synowicki
Institution: J.A. Woollam Company (United States)
Language: English
Topic: ZnO doping and properties
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2050460433