Work

Growth and Structure of Water on SiO2 Films on Si Investigated by Kelvin Probe Microscopy and in Situ X-ray Spectroscopies

Year: 2007

Type: article

Source: Langmuir

DOI: 10.1021/la700893w

Authors: Albert Verdaguer, Christoph Weis, Gerard Oncins, Guido Ketteler, Hendrik Bluhm, Miquel Salmeron

Institutions: Lawrence Berkeley National Laboratory, Institut Català de Nanociència i Nanotecnologia, Universitat de Barcelona, University of California, Berkeley

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2050839523

FWCI: 5.221

Cites: 30

Cited by: 195

Related to: 8