Work

Note: Alignment/focus dependent core-line sensitivity for quantitative chemical analysis in hard x-ray photoelectron spectroscopy using a hemispherical electron analyzer

Year: 2013

Type: article

Source: Review of Scientific Instruments

DOI: 10.1063/1.4795406

Authors: Conan Weiland, Raymond Browning, Barry A. Karlin, Daniel A. Fischer, Joseph C. Woicik

Institutions: National Institute of Standards and Technology, Material Measurement Laboratory

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: U.S. Department of Energy

Award: G338944111

OpenAlex ID: W2058429595

FWCI: 0.66

Cites: 6

Cited by: 11

Related to: 10