Energy-filtered electron backscatter diffraction
Year: 2007
Type: article
Source: Ultramicroscopy
Authors: Andrew Deal, Tejpal Hooghan, Alwyn Eades
Institution: GE Global Research (United States)
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2066798227