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Scanning Transmission Electron Microscope (STEM) Elemental Mapping by Electron Energy‐Loss Spectroscopy

Year: 1986

Type: article

Source: Annals of the New York Academy of Sciences

DOI: 10.1111/j.1749-6632.1986.tb34539.x

Author: R. D. LEAPMAN

Institution: National Institutes of Health

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2071210786

FWCI: 1.657

Cites: 20

Cited by: 38

Related to: 10