Effectiveness of microarchitecture test program generation
Year: 2000
Type: article
Source: IEEE Design & Test of Computers
DOI: 10.1109/54.895005
Authors: N. Utamaphethai, R.D.S. Blanton, J.P. Shen
Institution: Carnegie Mellon University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2072442688