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A new microprocessor testing method

Year: 1975

Type: article

Source: Euromicro Newsletter

DOI: 10.1016/0303-1268(75)90023-1

Author: James T Healy

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2080972450

FWCI:

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