Work

Scanning electron microscope observation of dislocations in semiconductor and metal materials

Year: 2010

Type: article

Source: Journal of Electron Microscopy

DOI: 10.1093/jmicro/dfq045

Authors: N. Kuwano, M. Itakura, Y. Nagatomo, S. Tachibana

Institutions: Kyushu University, Mitsubishi Materials (Japan)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2083087714

FWCI: 1.251

Cites: 16

Cited by: 24

Related to: 10