Work

Dielectric Breakdown Phenomena during Secondary Electron Emission Measurement of Sputter-Deposited MgO Films

Year: 2006

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.45.7875

Authors: Takeo Nakano, Takashi Fujimoto, Daisuke Nakada, Shigeru Baba

Institution: Seikei University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2085583576

FWCI: 0.196

Cites: 12

Cited by: 1

Related to: 10