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XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults

Year: 2008

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats.2008.57

Authors: Sunghoon Chun, Yongjoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang

Institution: Yonsei University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2089871192

FWCI: 0.178

Cites: 14

Cited by: 2

Related to: 10