Work

On identifying don't care inputs of test patterns for combinational circuits

Year: 2001

Type: article

DOI: 10.5555/603095.603170

Authors: Seiji Kajihara, Kohei Miyase

Institution: Kyushu Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2090855754

FWCI: 10.08

Cites: 16

Cited by: 68

Related to: 10