Work

Characterization of the “native” surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study

Year: 2006

Type: article

Source: Applied Surface Science

DOI: 10.1016/j.apsusc.2006.09.047

Authors: G. Bhargava, I. Gouzman, C.M. Chun, T.A. Ramanarayanan, S.L. Bernasek

Institutions: Princeton University, Soreq Nuclear Research Center, ExxonMobil (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2099778114

FWCI: 4.353

Cites: 21

Cited by: 394

Related to: 10