Work

On broad-side delay test

Year: 2002

Type: conference-paper

Source: IEEE VLSI Test Symposium (VTS)

DOI: 10.1109/vtest.1994.292299

Authors: J. Savir, S. Patil

Institutions: IBM (United States), IBM Research - Austin

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2108103162

FWCI: 6.22

Cites: 16

Cited by: 147

Related to: 10