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Analog circuit fault diagnosis using fuzzy approach based on functional decomposition

Year: 2002

Type: conference-paper

DOI: 10.1109/ciccas.1991.184399

Authors: Bin He, Wei Ping Zhang, Yuan Wang

Institution: Beijing Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2109447222

FWCI:

Cites: 3

Cited by: 1

Related to: 10