Observation of velocity overshoot in silicon inversion layers
Year: 1993
Type: article
Source: IEEE Electron Device Letters
DOI: 10.1109/55.244738
Authors: F. Assaderaghi, P.K. Kop, C. Hu
Institution: University of California, Berkeley
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2115282592