Work

Limitations in predicting defect level based on stuck-at fault coverage

Year: 2002

Type: conference-paper

Source: IEEE VLSI Test Symposium (VTS)

DOI: 10.1109/vtest.1994.292315

Authors: J. Park, M. Naivar, R. Kapur, M.R. Mercer, T.W. Williams

Institutions: The University of Texas at Austin, Los Alamos National Laboratory, IBM (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2115648995

FWCI: 4.242

Cites: 10

Cited by: 28

Related to: 10