Work

Software-based self-testing methodology for processor cores

Year: 2001

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/43.913755

Authors: Li Chen, S. Dey

Institution: University of California San Diego

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Carnegie Mellon University, University of California, San Diego, Center for Wireless Communications, University of California, San Diego

OpenAlex ID: W2115795793

FWCI: 16.21

Cites: 32

Cited by: 229

Related to: 10