Work

A novel approach for reducing the area occupied by contact pads on process control chips

Year: 1990

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.1990.67883

Authors: A.J. Walton, W. Gammie, D. Morrow, J.T.M. Stevenson, R.J. Holwill

Institution: University of Edinburgh

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2116732959

FWCI: 0.669

Cites: 15

Cited by: 18

Related to: 10