Work

Soft-Error Vulnerability of Sub-100-nm Flip-Flops

Year: 2008

Type: conference-paper

Source: IEEE International On-Line Testing Symposium (IOLTS)

DOI: 10.1109/iolts.2008.12

Author: Tino Heijmen

Institution: NXP (Netherlands)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2119795588

FWCI: 5.213

Cites: 6

Cited by: 23

Related to: 10