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Tino Heijmen
Observed names:
Heijmen, TGA,
T. Heijmen,
TINO HEIJMEN
Observed institutions:
NXP (Netherlands),
Philips (Netherlands),
Signify (Netherlands)
OpenAlex ID:
A5064322830
Symmetry-adapted perturbation theory for the calculation of Hartree-Fock interaction energies
1996
·
ROBERT MOSZYNSKI
, TINO HEIJMEN
, et al.
·
Molecular Physics
·
182
PDF
Factors That Impact the Critical Charge of Memory Elements
2006
·
T. Heijmen
, D. Giot
, et al.
·
IEEE International On-Line Testing Symposium (IOLTS)
·
136
A Comprehensive Study on the Soft-Error Rate of Flip-Flops From 90-nm Production Libraries
2007
·
Tino Heijmen
, Philippe Roche
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
75
Analytical semi-empirical model for SER sensitivity estimation of deep-submicron CMOS circuits
2005
·
T. Heijmen
·
IEEE International On-Line Testing Symposium (IOLTS)
·
46
Soft-Error Rate Testing of Deep-Submicron Integrated Circuits
2006
·
T. Heijmen
, A. Nieuwland
·
IEEE European Test Symposium (ETS)
·
34
A Comparative Study on the Soft-Error Rate of Flip-Flops from 90-nm Production Libraries
2006
·
Tino Heijmen
, Philippe Roche
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
27
Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options
2005
·
Tino Heijmen
, Bram Kruseman
·
Solid-State Electronics
·
27
Soft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends
2010
·
Tino Heijmen
·
Frontiers in electronic testing
·
25
Soft-Error Vulnerability of Sub-100-nm Flip-Flops
2008
·
Tino Heijmen
·
IEEE International On-Line Testing Symposium (IOLTS)
·
23
Technology scaling of critical charges in storage circuits based on cross-coupled inverter-pairs
2004
·
T. Heijmen
, B. Kruseman
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
18
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs
2007
·
Tino Heijmen
·
IEEE International On-Line Testing Symposium (IOLTS)
·
13
Altitude and underground real-time SER tests of embedded SRAM
2009
·
Tino Heijmen
, Joop Verwijst
·
European Conference on Radiation and Its Effects on Components and Systems
·
11
Interconnect Optimization by Semidefinite Programming
2004
·
Tino Heijmen
, Jaap van Staalduinen
·
Mathematics in industry
·
2
Soft Error Rates in Deep-Submicron CMOS Technologies
2006
·
T. Heijmen
·
IEEE International On-Line Testing Symposium (IOLTS)
·
1
Special Session 3 – Panel: SER in Automotive: what is the impact of the AEC Q100-G spec?
2008
·
Tino Heijmen
·
IEEE International On-Line Testing Symposium (IOLTS)
Optimization of electronic circuits
2006
·
Maten, EJW Jan ter
, Heijmen, TGA
, et al.
·
TU/e Research Portal
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Works count:
17
Citation count:
620
H-index:
11
I10-index:
12
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