Work

A Comprehensive Study on the Soft-Error Rate of Flip-Flops From 90-nm Production Libraries

Year: 2007

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2007.897517

Authors: Tino Heijmen, Philippe Roche, Gilles Gasiot, Keith R. Forbes, Damien Giot

Institutions: NXP (Netherlands), STMicroelectronics (France)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2033907418

FWCI: 6.721

Cites: 28

Cited by: 75

Related to: 10