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Keith R. Forbes
Observed names:
Forbes, Keith R.,
K. R. Forbes,
K.R. Forbes,
Keith Forbes
Observed institutions:
Motorola (United States),
Stanford University
OpenAlex ID:
A5008328477
A Comprehensive Study on the Soft-Error Rate of Flip-Flops From 90-nm Production Libraries
2007
·
Tino Heijmen
, Philippe Roche
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
75
Dislocation energies for an anisotropic cubic crystal calculations and observations for NiAl
1993
·
U. Glatzel
, K. R. Forbes
, et al.
·
Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties
·
28
A Comparative Study on the Soft-Error Rate of Flip-Flops from 90-nm Production Libraries
2006
·
Tino Heijmen
, Philippe Roche
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
27
High- temperature deformation properties of nial single crystals
1996
·
K. R. Forbes
, U. Glatzel
, et al.
·
Metallurgical and Materials Transactions A
·
22
Characterization of the time-dependent reliability fallout as a function of yield for a 130nm SRAM device and application to optimize production burn-in
2004
·
K.R. Forbes
, P. Schani
·
IEEE International Reliability Physics Symposium proceedings
·
16
High Temperature Deformation of Single Crystals of NiAl
1992
·
Keith R. Forbes
, Uwe Glatzel
, et al.
·
MRS Proceedings
·
9
On the question of strain rate continuity in stress rate change experiments
1990
·
Chen-Ming Kuo
, Keith R. Forbes
, et al.
·
Scripta Metallurgica et Materialia
·
6
Product failures: Power-law or exponential voltage dependence?
2010
·
Amr Haggag
, Keith Forbes
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
4
Using time-dependent reliability fallout as a function of yield to optimize burn-in time for a 130 nm SRAM device
2004
·
K.R. Forbes
, N. Arguello
·
IEEE International Integrated Reliability Workshop final report
·
3
Transient Deformation Of Single Crystal NiAl at High Temperatures
1992
·
Keith R. Forbes
, William D Nix
·
MRS Proceedings
·
3
Tem Observations of Dislocation Structures in Single Crystals of NiAl After High Temperature Creep
1992
·
Uwe Glatzel
, Keith R. Forbes
, et al.
·
MRS Proceedings
·
2
An Eight-Inch Diameter, Heavily Confined Card Gap Test
1985
·
Foster, Joseph C., Jr.
, Forbes, Keith R.
, et al.
·
Defense Technical Information Center (DTIC)
·
2
An investigation of thermally-sprayed aluminum oxide coatings for high-temperature electrostatic chucks (ESCs)
2002
·
C.J. Swindeman
, R.D. Seals
, et al.
·
IEEE International Symposium on Semiconductor Manufacturing conference proceedings
·
1
High-temperature deformation processes and strengthening mechanisms in intermetallic particulate composites. Final technical report, Dec 88-Dec 91
1992
·
W.D. Nix
, Keith R. Forbes
, et al.
·
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Investigation of stress distribution of changes of section of members under two dimensional bending and direct stress
1970
·
Keith R. Forbes
·
Research Online (University of Wollongong)
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Works count:
15
Citation count:
198
H-index:
6
I10-index:
5
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