Work

Special Session 3 – Panel: SER in Automotive: what is the impact of the AEC Q100-G spec?

Year: 2008

Type: conference-paper

Source: IEEE International On-Line Testing Symposium (IOLTS)

DOI: 10.1109/iolts.2008.68

Author: Tino Heijmen

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2029440293

FWCI:

Cites:

Cited by:

Related to: 10