Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options
Year: 2005
Type: article
Source: Solid-State Electronics
Authors: Tino Heijmen, Bram Kruseman
Institutions: Philips (Netherlands), Signify (Netherlands)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2004236878