Work

I/sub DDQ/ measurement based diagnosis of bridging faults in full scan circuits

Year: 2002

Type: conference-paper

Source: International Conference on VLSI Design

DOI: 10.1109/icvd.1994.282680

Authors: S. Chakravarty, S. Suresh

Institution: University at Buffalo, State University of New York

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2123402633

FWCI: 0.604

Cites: 10

Cited by: 11

Related to: 9