Work

MVP: Minimum-Violations Partitioning for Reducing Capture Power in At-Speed Delay-Fault Testing

Year: 2011

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2011.2162237

Authors: Zhen Chen, Krishnendu Chakrabarty, Dong Xiang

Institutions: Tsinghua University, Duke University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2126451656

FWCI: 0.734

Cites: 22

Cited by: 6

Related to: 10