Fault detection in stack filter circuits based on sample selection probabilities
Year: 2002
Type: conference-paper
Authors: Imed Ben Dhaou, D. Akopian, P. Kuosmanen, J. Astola
Institutions: Tampere University of Technology, University of Tampere
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2126816869