Work

Automatic test program generation from RT-level microprocessor descriptions

Year: 2003

Type: conference-paper

Source: International Symposium on Quality Electronic Design (ISQED)

DOI: 10.1109/isqed.2002.996710

Authors: F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero

Institution: Politecnico di Torino

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2129219479

FWCI: 0.688

Cites: 10

Cited by: 5

Related to: 10