Work

A new paradigm in test for the next millennium

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2000.894239

Authors: J. Katz, R. Rajsuman

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2129900191

FWCI: 1.992

Cites: 1

Cited by: 12

Related to: 10