Work

Microprocessors functional testing techniques

Year: 1989

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/43.21850

Authors: E.-S.A. Talkhan, A.M.H. Ahmed, A.E. Salama

Institution: Cairo University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2131021655

FWCI: 0.434

Cites: 7

Cited by: 16

Related to: 10