Work

Transition density, a stochastic measure of activity in digital circuits

Year: 1991

Type: conference-paper

Source: ACM/IEEE Design Automation Conference (DAC)

DOI: 10.1145/127601.127744

Author: Farid N. Najm

Institution: Texas Instruments (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2133762912

FWCI: 7.929

Cites: 11

Cited by: 249

Related to: 9