Work

Partial scan beyond cycle cutting

Year: 2002

Type: conference-paper

Source: IEEE International Symposium on Fault-Tolerant Computing

DOI: 10.1109/ftcs.1997.614106

Authors: G.S. Saund, M.S. Hsiao, J.H. Patel

Institutions: University of Illinois Urbana-Champaign, University of Illinois System

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2134283834

FWCI: 0.604

Cites: 23

Cited by: 16

Related to: 10