Work

Combinational test generation using satisfiability

Year: 1996

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/43.536723

Authors: P. Stephan, R.K. Brayton, A.L. Sangiovanni-Vincentelli

Institutions: Synopsys (United States), University of California, Berkeley

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2135613306

FWCI: 13.87

Cites: 68

Cited by: 316

Related to: 10