Work

A case-study in the use of scan in microSPARC testing and debug

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.1994.527987

Author: J. Katz

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2140891446

FWCI: 1.992

Cites: 3

Cited by: 21

Related to: 10