Work

On the Design of Easily Testable Iterative Systems of Combinational Cells

Year: 1979

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/tc.1979.1675368

Author: Coy

Institution: TU Dortmund University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2145473189

FWCI:

Cites: 6

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Related to: 10