Work

Interface degradation of Al heavy wire bonds on power semiconductors during active power cycling measured by the shear test

Year: 2010

Type: conference-paper

Source: Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)

Authors: Jens Goehre, Martin Schneider‐Ramelow, Ute Geisler, Klaus‐Dieter Lang

Institutions: Fraunhofer Institute for Reliability and Microintegration, Technische Universität Berlin

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2145671267

FWCI: 5.561

Cites: 12

Cited by: 54

Related to: 10