Work

Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers

Year: 2007

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2007.8361583

Authors: Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2149124583

FWCI: 4.344

Cites: 18

Cited by: 41

Related to: 10