Work

Scan latch partitioning into multiple scan chains for power minimization in full scan sequential circuits

Year: 2000

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1145/343647.343901

Authors: N. Nicolici, M. Al-Hashimi

Institution: University of Southampton

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Virginia Polytechnic Institute and State University

OpenAlex ID: W2153309099

FWCI: 1.739

Cites: 25

Cited by: 21

Related to: 10